{"id":20004,"date":"2025-03-18T10:36:40","date_gmt":"2025-03-18T10:36:40","guid":{"rendered":"https:\/\/www.hotelsalepage.com\/feed\/cision-pr-newswire\/star-virgo-prima-series-3d-2-5d-mems-probe-card-for-wat-test\/"},"modified":"2025-03-18T10:36:40","modified_gmt":"2025-03-18T10:36:40","slug":"star-virgo-prima-series-3d-2-5d-mems-probe-card-for-wat-test","status":"publish","type":"post","link":"https:\/\/thaipropertynews.com\/feeds\/?p=20004","title":{"rendered":"STAr Virgo Prima Series 3D\/2.5D MEMS Probe Card for WAT Test"},"content":{"rendered":"<p><span class=\"legendSpanClass\">HSINCHU<\/span>, <span class=\"legendSpanClass\"><span class=\"xn-chron\">March 18, 2025<\/span><\/span> \/PRNewswire\/ &#8212; STAr Technologies, a leading probe card manufacturer, has been engaged in probe card technology for 25 years and is at the cutting edge of probe card manufacturing. The launch of <span class=\"xn-person\">STAr Virgo Prima<\/span>, which is one of probe card series for semiconductor parametric and reliability test, presents the achievement in 3D\/2.5D MEMS probe card development for WAT test (Wafer Acceptance Test, WAT) and provides users the positive effects on test efficiency and reliable results.<\/p>\n<div class=\"PRN_ImbeddedAssetReference\">\n<p> <a href=\"https:\/\/mma.prnasia.com\/media2\/2643838\/20250318_STAr_Virgo_Prima.html\" target=\"_blank\" rel=\"nofollow\"> <img decoding=\"async\" src=\"https:\/\/mma.prnasia.com\/media2\/2643838\/20250318_STAr_Virgo_Prima.jpg?p=medium600\" title=\"STAr Virgo Prima is MEMS micro-cantilever probe card for WAT test\" alt=\"STAr Virgo Prima is MEMS micro-cantilever probe card for WAT test\" \/> <\/a> <br \/><span>STAr Virgo Prima is MEMS micro-cantilever probe card for WAT test<\/span><\/p>\n<\/div>\n<p>MEMS (Micro-Electro-Mechanical Systems, MEMS) probe card with the optimized structure and is an ideal to support fine-pitch and high-pin count test requirements. The Virgo Prima MEMS micro-cantilever probe cards taking the advantages of MEMS probe and experience-based techniques are designed specifically for nanometer technology, node processing and extend performance beyond existing WAT test probe cards.<\/p>\n<p><b>Virgo Prima Probe Card features include<\/b><b>\uff1a<\/b><\/p>\n<ul type=\"disc\">\n<li>Small probe mark with low-scrub depth<\/li>\n<li>Low parasitic\u00a0LC and low leakage current<\/li>\n<li>Superior ground shield for complete noise isolation<\/li>\n<li>High-temperature reliability tests up to 200degC (HCI, NBTI, TDDB, EM)<\/li>\n<\/ul>\n<p>&#8220;WAT probe cards play a vital role in characterization qualification to the manufacturing of semiconductor.&#8221; <span class=\"xn-person\">Yu-Ming Chien<\/span>, STAr Technologies&#8217; Senior Vice President of Test and Measurement Business Unit commented, &#8220;STAr Virgo Prima Series ensure excellent test performance and exactly corresponding to the emerging test needs semiconductor industry and technologies of diverse applications.&#8221;<\/p>","protected":false},"excerpt":{"rendered":"<p><!-- wp:html --><\/p>\n<p><span class=\"legendSpanClass\">HSINCHU<\/span>, <span class=\"legendSpanClass\"><span class=\"xn-chron\">March 18, 2025<\/span><\/span> \/PRNewswire\/ &#8212; STAr Technologies, a leading probe card manufacturer, has been engaged in probe card technology for 25 years and is at the cutting edge of probe card manufacturing. The launch of <span class=\"xn-person\">STAr Virgo Prima<\/span>, which is one of probe card series for semiconductor parametric and reliability test, presents the achievement in 3D\/2.5D MEMS probe card development for WAT test (Wafer Acceptance Test, WAT) and provides users the positive effects on test efficiency and reliable results.<\/p>\n<div class=\"PRN_ImbeddedAssetReference\">\n<p> <a href=\"https:\/\/mma.prnasia.com\/media2\/2643838\/20250318_STAr_Virgo_Prima.html\" target=\"_blank\" rel=\"nofollow\"> <img decoding=\"async\" src=\"https:\/\/mma.prnasia.com\/media2\/2643838\/20250318_STAr_Virgo_Prima.jpg?p=medium600\" title=\"STAr Virgo Prima is MEMS micro-cantilever probe card for WAT test\" alt=\"STAr Virgo Prima is MEMS micro-cantilever probe card for WAT test\" \/> <\/a> <br \/><span>STAr Virgo Prima is MEMS micro-cantilever probe card for WAT test<\/span><\/p>\n<\/div>\n<p>MEMS (Micro-Electro-Mechanical Systems, MEMS) probe card with the optimized structure and is an ideal to support fine-pitch and high-pin count test requirements. The Virgo Prima MEMS micro-cantilever probe cards taking the advantages of MEMS probe and experience-based techniques are designed specifically for nanometer technology, node processing and extend performance beyond existing WAT test probe cards.<\/p>\n<p><b>Virgo Prima Probe Card features include<\/b><b>\uff1a<\/b><\/p>\n<ul type=\"disc\">\n<li>Small probe mark with low-scrub depth<\/li>\n<li>Low parasitic\u00a0LC and low leakage current<\/li>\n<li>Superior ground shield for complete noise isolation<\/li>\n<li>High-temperature reliability tests up to 200degC (HCI, NBTI, TDDB, EM)<\/li>\n<\/ul>\n<p>&#8220;WAT probe cards play a vital role in characterization qualification to the manufacturing of semiconductor.&#8221; <span class=\"xn-person\">Yu-Ming Chien<\/span>, STAr Technologies&#8217; Senior Vice President of Test and Measurement Business Unit commented, &#8220;STAr Virgo Prima Series ensure excellent test performance and exactly corresponding to the emerging test needs semiconductor industry and technologies of diverse applications.&#8221;<\/p>\n<p><!-- \/wp:html --><\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"open","ping_status":"open","sticky":false,"template":"","format":"standard","meta":{"rop_custom_images_group":[],"rop_custom_messages_group":[],"rop_publish_now":"initial","rop_publish_now_accounts":[],"rop_publish_now_history":[],"rop_publish_now_status":"pending","footnotes":""},"categories":[5,7],"tags":[],"class_list":["post-20004","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-cision-pr-newswire","category-cision-pr-newswire-en"],"_links":{"self":[{"href":"https:\/\/thaipropertynews.com\/feeds\/index.php?rest_route=\/wp\/v2\/posts\/20004","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/thaipropertynews.com\/feeds\/index.php?rest_route=\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/thaipropertynews.com\/feeds\/index.php?rest_route=\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/thaipropertynews.com\/feeds\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/thaipropertynews.com\/feeds\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=20004"}],"version-history":[{"count":0,"href":"https:\/\/thaipropertynews.com\/feeds\/index.php?rest_route=\/wp\/v2\/posts\/20004\/revisions"}],"wp:attachment":[{"href":"https:\/\/thaipropertynews.com\/feeds\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=20004"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/thaipropertynews.com\/feeds\/index.php?rest_route=%2Fwp%2Fv2%2Fcategories&post=20004"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/thaipropertynews.com\/feeds\/index.php?rest_route=%2Fwp%2Fv2%2Ftags&post=20004"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}